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 H5N3004P
Silicon N Channel MOS FET High Speed Power Switching
ADE-208-1523 (Z) Rev.0 Apr. 2002 Features
* Low on-resistance * Low leakage current * High speed switching * Low gate charge (Qg) * Avalanche ratings
Outline
TO-3P
D
G
1
S
2
3
1. Gate 2. Drain (Flange) 3. Source
H5N3004P
Absolute Maximum Ratings
(Ta=25C)
Item Drain to source voltage Gate to source voltage Drain current Drain peak current Body-drain diode reverse drain current Body-drain diode reverse drain peak current Avalanche current Channel dissipation Channel to case Thermal impedance Channel temperature Storage temperature Notes: 1. PW 10 s, duty cycle 1% 2. Value at Tc = 25C 3. Tch 150C Symbol VDSS VGSS ID ID (pulse) IDR IDR (pulse) IAPNote Pch
3
Note1 Note1
Ratings 300 30 25 100 25 100 25 150 0.833 150 -55 to +150
Unit V V A A A A A W C/W C C
Note2
ch-c Tch Tstg
Rev.0, Apr. 2002, page 2 of 2
H5N3004P
Electrical Characteristics
(Ta=25C)
Item Drain to source breakdown voltage Zero gate voltage drain current Gate to source leak current Gate to source cutoff voltage Forward transfer admittance Static drain to source on state resistance Input capacitance Output capacitance Reverse transfer capacitance Turn-on delay time Rise time Turn-off delay time Fall time Total gate charge Gate to source charge Gate to drain charge Body-drain diode forward voltage Body-drain diode reverse recovery time Body-drain diode reverse recovery charge Notes: 4. Pulse test Symbol Min V(BR)DSS IDSS IGSS VGS(off) |yfs| RDS(on) Ciss Coss Crss td(on) tr td(off) tf Qg Qgs Qgd VDF trr Qrr 300 -- -- 3.0 15 -- -- -- -- -- -- -- -- -- -- -- -- -- -- Typ * * * * 25 0.076 3600 400 100 50 120 180 90 110 18 55 0.9 250 2.3 Max -- 1 0.1 4.0 -- 0. 093 * * * * -- * -- -- -- -- 1.35 -- -- Unit V A A V S pF pF pF ns ns ns ns nC nC nC V ns C Test Conditions ID = 10 mA, VGS = 0 VDS = 300 V, VGS = 0 VGS = 30 V, VDS = 0 VDS = 10 V, ID = 1 mA ID = 12.5 A, VDS = 10 VNote ID = 12.5 A, VGS= 10 VNote VDS = 25 V VGS = 0 f = 1 MHz ID= 12.5 A RL = 12 VGS = 10 V Rg = 10 VDD = 240 V VGS = 10 V ID = 25 A IF = 25 A, VGS = 0 IF = 25 A, VGS = 0 diF/dt = 100 A/s
4 4
Rev.0, Apr. 2002, page 3 of 3
H5N3004P
Main Characteristics
Power vs. Temperature Derating 200
Channel Dissipation Pch (W)
1000 300
Drain Current ID (A)
Maximum Safe Operation Area
150
100 30 10 3
DC Op
PW
er at
1m
= 10
(T
10
s
10 0
s
s
100
m
ion
s(
1s
ho
)
50
0.3 0.1 0 50 100 150 200
Operation in 1 this area is limited by RDS(on)
c=
t)
25
C
Ta = 25C 1 30 3 10 100 300 1000 Drain to Source Voltage VDS (V)
Case Temperature Tc (C)
Typical Output Characteristics 100 Pulse Test 80
Drain Current ID (A)
Typical Transfer Characteristics 100 V DS = 10 V Pulse Test 80
10 V 8V 6.5 V
Drain Current ID (A)
7V 60
60
6V 40 5.5 V VGS = 5 V 0 4 8 12 16 20 Drain to Source Voltage VDS (V)
40 Tc = 75C 20 25C -25C 0 2 4 6 8 10 Gate to Source Voltage VGS (V)
20
Rev.0, Apr. 2002, page 4 of 4
H5N3004P
Drain to Source Saturation Voltage VDS(on) (V)
Drain to Source Saturation Voltage vs. Gate to Source Voltage Pulse Test
Drain to Source on State Resistance RDS(on) (m)
5
4
Static Drain to Source on State Resistance vs. Drain Current 200 Pulse Test VGS = 10 V, 15 V 100
3 I D = 25 A 15 A 1 5A 0 12 4 8 Gate to Source Voltage 16 VGS (V) 20
50
2
20
10 1 2 5 10 20 50 Drain Current ID (A) 100
Drain to source on State Resistance RDS(on) (m)
Forward Transfer Admittance |yfs| (S)
Static Drain to Source on State Resistance vs. Temperature 200 Pulse Test I D = 25 A V GS = 10 V 160 15 A 120 5A 80
Forward Transfer Admittance vs. Drain Current 100 50 20 10 5 2 1 0.5 0.2 0.2 0.5 1 2 5 V DS = 10 V Pulse Test 10 20 50 100 Drain Current ID (A) 75C 25C Tc = -25C
40 0 -40
0 40 80 120 160 Case Temperature Tc (C)
Rev.0, Apr. 2002, page 5 of 5
H5N3004P
Body-Drain Diode Reverse Recovery Time 1000
Reverse Recovery Time trr (ns) Capacitance C (pF)
50000 20000 10000 5000 2000 1000 500 200 100 50
Typical Capacitance vs. Drain to Source Voltage VGS = 0 f = 1 MHz
500 200 100 50
Ciss
Coss Crss 0 25 50 75 100 125
20 10 0.1
di / dt = 100 A / s V GS = 0, Ta = 25C 0.3 1 3 10 30 100 Reverse Drain Current IDR (A)
Drain to Source Voltage VDS (V)
Dynamic Input Characteristics
VDS (V)
500 I D = 25 A 400 V DD = 50 V 100 V 240 V VDS VGS
20
VGS (V)
10000
Switching Characteristics V GS = 10 V, VDD = 150 V PW = 10 s, duty < 1 % R G =10
(ns)
16
Drain to Source Voltage
Gate to Source Voltage
1000
Switching Time t
300
12
tr t d(off) 100 tf tf t d(on)
200
8
100
V DD = 240 V 100 V 50 V 40 80 120 160 Gate Charge Qg (nC)
4 0 200
tr 10 0.1 0.3 1 3 Drain Current 10 ID
0
30 (A)
100
Rev.0, Apr. 2002, page 6 of 6
H5N3004P
Reverse Drain Current vs. Source to Drain Voltage Gate to Source Cutoff Voltage vs. Case Temperature
Gate to Source Cutoff Voltage VGS(off) (V)
100
5
(A)
V DS = 10 V I D = 10 mA 1 mA 0.1 mA
Reverse Drain Current IDR
80 V GS = 0 V
4
60
3
40 10 V Pulse Test 0 0.4 0.8 1.2 1.6 VSD (V) 2.0 Source to Drain Voltage
2
20
5V
1 0 -50
0 50 100 150 Case Temperature Tc (C)
200
Switching Time Test Circuit Vin Monitor D.U.T. RL 10 Vin 10 V V DD = 150 V Vin Vout 10% 10% Vout Monitor
Waveform
90%
10% 90% td(off) tf
90% td(on) tr
Rev.0, Apr. 2002, page 7 of 7
H5N3004P
Normalized Transient Thermal Impedance vs. Pulse Width 3 Tc = 25C 1 D=1 0.5 0.3
0.2
Normalized Transient Thermal Impedance s (t)
0.1
Gch
0.1
0.05
Gch
- c(t) = Cs (t) * Gch - c - c = 0.833C/W, Tc = 25C D=
PW T
PDM
0.03
0.02 1 0.0
PW T
0.01 10
1s
h
p ot
uls
e
100
1m
10 m Pulse Width PW (S)
100 m
1
10
Rev.0, Apr. 2002, page 8 of 8
H5N3004P
Package Dimensions
As of July, 2001
5.0 0.3
15.6 0.3 4.8 0.2 1.5
Unit: mm
0.5
1.0
3.2 0.2
14.9 0.2
19.9 0.2
1.6 1.4 Max 2.0 2.8
2.0
1.0 0.2
18.0 0.5
0.6 0.2
3.6
0.9 1.0
5.45 0.5
5.45 0.5
Hitachi Code JEDEC JEITA Mass (reference value) TO-3P -- Conforms 5.0 g
0.3
Rev.0, Apr. 2002, page 9 of 9
H5N3004P
Disclaimer
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi's or any third party's patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party's rights, including intellectual property rights, in connection with use of the information contained in this document. 2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use. 3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi's sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support. 4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product. 5. This product is not designed to be radiation resistant. 6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi. 7. Contact Hitachi's sales office for any questions regarding this document or Hitachi semiconductor products.
Sales Offices
Hitachi, Ltd.
Semiconductor & Integrated Circuits Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Tel: (03) 3270-2111 Fax: (03) 3270-5109
URL
http://www.hitachisemiconductor.com/
For further information write to:
Hitachi Semiconductor (America) Inc. 179 East Tasman Drive San Jose,CA 95134 Tel: <1> (408) 433-1990 Fax: <1>(408) 433-0223 Hitachi Europe Ltd. Electronic Components Group Whitebrook Park Lower Cookham Road Maidenhead Berkshire SL6 8YA, United Kingdom Tel: <44> (1628) 585000 Fax: <44> (1628) 585200 Hitachi Europe GmbH Electronic Components Group Dornacher Strae 3 D-85622 Feldkirchen Postfach 201, D-85619 Feldkirchen Germany Tel: <49> (89) 9 9180-0 Fax: <49> (89) 9 29 30 00 Hitachi Asia Ltd. Hitachi Tower 16 Collyer Quay #20-00 Singapore 049318 Tel : <65>-538-6533/538-8577 Fax : <65>-538-6933/538-3877 URL : http://semiconductor.hitachi.com.sg Hitachi Asia Ltd. (Taipei Branch Office) 4/F, No. 167, Tun Hwa North Road Hung-Kuo Building Taipei (105), Taiwan Tel : <886>-(2)-2718-3666 Fax : <886>-(2)-2718-8180 Telex : 23222 HAS-TP URL : http://www.hitachi.com.tw Hitachi Asia (Hong Kong) Ltd. Group III (Electronic Components) 7/F., North Tower World Finance Centre, Harbour City, Canton Road Tsim Sha Tsui, Kowloon Hong Kong Tel : <852>-(2)-735-9218 Fax : <852>-(2)-730-0281 URL : http://semiconductor.hitachi.com.hk
Copyright (c) Hitachi, Ltd., 2002. All rights reserved. Printed in Japan.
Colophon 5.0
Rev.0, Apr. 2002, page 10 of 10


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